{"id":14785,"date":"2024-03-12T09:31:28","date_gmt":"2024-03-12T08:31:28","guid":{"rendered":"https:\/\/www.icpf.cas.cz\/?page_id=14785"},"modified":"2024-03-18T15:45:21","modified_gmt":"2024-03-18T14:45:21","slug":"instrumentation-8","status":"publish","type":"page","link":"https:\/\/www.icpf.cas.cz\/en\/instrumentation-8\/","title":{"rendered":"Instrumentation – Research Group of Laser Chemistry"},"content":{"rendered":"\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
Device \/ Manufacturer (Country)<\/span><\/span><\/span><\/strong><\/td>\n\u00a0<\/strong><\/td>\nDescription of the Experiment or Analysis<\/span><\/span><\/span><\/strong><\/td>\nMade<\/strong><\/td>\nService<\/strong><\/td>\n<\/tr>\n
Pulse IR (TEA) CO2 Laser<\/a> \/ Plovdiv University (Bulgaria)<\/span><\/span><\/span><\/td>\n\u00a0<\/td>\nLaser deposition and ablation with tuneable infrared 9.6 to 10.6 \u03bcm, pulse energy up to 1 J with a repetition rate of 1 Hz
\n<\/span><\/span><\/span><\/td>\n		1988<\/td>\nRG8<\/td>\n<\/tr>\n
ArF UV Excimer Laser ASX-750<\/a> \/ Semento (Estonia)<\/span><\/span><\/span><\/td>\n\u00a0<\/td>\nLaser deposition and ablation using deep-UV radiation with 193 nm, pulse energy up to 150 mJ with a repetition rate of 10 Hz<\/span><\/span><\/span><\/td>\n2015<\/td>\nRG8<\/td>\n<\/tr>\n
Sputter Coater Q 150T ES Plus<\/a> \/ Quorum Technologies Ltd. (UK)<\/td>\n\u00a0<\/td>\nSputtering of thin conductive (Au, Pt, Ag, Cr) layers for electron<\/span><\/span> microscopy, preparation of carbon layers<\/span><\/span><\/span><\/td>\n2021<\/td>\nRG8<\/td>\n<\/tr>\n
RF Generator Model 300<\/a> \/ Elite (USA)<\/td>\n\u00a0<\/td>\n13.56 MHz RF plasma generation with a matchbox for silicon layer deposition
\n<\/span><\/span><\/span><\/td>\n		2020<\/td>\nFajgar Ko\u0161tejn<\/td>\n<\/tr>\n
FTIR Spectrometer Nicolet Avatar 360<\/a> \/ Thermo Scientific (USA)<\/td>\n\u00a0<\/td>\nMeasurement of IR spectra by transmission, reflection, or ATR technique, basic characterization of vibrational states<\/span><\/span><\/span><\/td>\n1997<\/td>\nRG8<\/td>\n<\/tr>\n
Raman Spectrometer Almega XR<\/a> \/ Thermo Scientific (USA)<\/td>\n\u00a0<\/td>\nMeasurement of Raman spectra with optical microscopy (Olympus BX51, 473 nm), basic characterization of vibrational states<\/span><\/span><\/span><\/td>\n2007<\/td>\nRG8<\/td>\n<\/tr>\n
UV-Vis Spectrometer Model 1800<\/a> \/ Shimadzu Corp. (Japan)<\/td>\n\u00a0<\/td>\nMeasurement of abs. spectra with high<\/span><\/span> resol. (190 – 1100 nm), extension for transmission and reflection mode, optical band gap<\/span><\/span><\/span><\/td>\n2018<\/td>\nFajgar Ko\u0161tejn<\/td>\n<\/tr>\n
XPS Photoelectron Spectrometer ESCA 3400<\/a> \/ Kratos (UK)<\/td>\n\u00a0<\/td>\n\n
Determination of surface stoichiometry and chem. states of powders and smaller samples (with a diameter of up to 1 cm), dedusting of the surface with Ar+<\/sup> ions (depth profiling), measurement of valence spectra and band-gap<\/span><\/span><\/span><\/div>\n<\/td>\n
2014<\/td>\nFajgar Ko\u0161tejn<\/td>\n<\/tr>\n
Scanning Electron Microscope (SEM) Tescan Indusem<\/a> equipped with EDX 5010 XFlash Detector<\/span><\/span><\/span> \/ Bruker (Germany)<\/td>\n\u00a0<\/td>\nDisplay of prepared materials and atom determination<\/span><\/span> composition of samples (B and elements with higher atomic weight) from a depth of up to 1 \u03bcm with an accuracy of approx. 10 rel%, accelerating voltage 5 \u2013 30 kV<\/span><\/span><\/span><\/td>\n2012<\/td>\nFajgar Ko\u0161tejn<\/td>\n<\/tr>\n
Powder X-ray Diffractometer D8 Advance Eco<\/a> \/ Bruker (Germany)<\/td>\n\u00a0<\/td>\nMeasurement of phase composition of powdered solid samples and thin layers, determination of crystallite size 1 to 100 nm, thickness determination of thin layers up to 100 nm by reflection technique
\n<\/span><\/span><\/span><\/td>\n		2020<\/td>\nFajgar Ko\u0161tejn<\/td>\n<\/tr>\n
Thermogravimetric System TG209 F1 Libra<\/a> \/ Netzsch (Germany)<\/td>\n\u00a0<\/td>\nThermogravimetric analysis for measuring the temperature dependence of the decomposition of substances (possibility of connection with FTIR)<\/span><\/span><\/span><\/td>\n2019<\/td>\nJandov\u00e1<\/td>\n<\/tr>\n
Potentiostat Model 2450EC<\/a> \/ Keithley (USA)<\/td>\n\u00a0<\/td>\nIt is used for measuring the electrochemical properties of materials, standard measurements of cyclic voltammetry, chronoamperometry, and chronovoltammetry, determining the properties of battery systems for CO2<\/sub> reduction and water electrolysis<\/span><\/span><\/span><\/td>\n2018<\/td>\nKo\u0161tejn Jandov\u00e1<\/td>\n<\/tr>\n
Potentiostat Autolab M101<\/a>, 10A booster \/ Metrohm (Netherlands<\/span><\/span><\/span>)<\/td>\n\u00a0<\/td>\n2021<\/td>\nDytrych Ko\u0161tejn<\/td>\n<\/tr>\n
Potentiostat SP200<\/a>, 20A booster \/ BioLogic (Netherlands<\/span><\/span><\/span>)<\/td>\n\u00a0<\/td>\n2021<\/td>\nDytrych Ko\u0161tejn<\/td>\n<\/tr>\n
Fluorescence Microscope AF3T \/ Arsenal (\u010cR)
\n<\/span><\/span><\/span><\/td>\n		\u00a0<\/td>\nFluorescence and optical microscopy, the possibility of connection with a UV-Vis spectrometer for measuring fluorescence spectra<\/span><\/span><\/span><\/td>\n2003<\/td>\nRG8<\/td>\n<\/tr>\n
Metallographic Microscope AM2T \/ Arsenal (\u010cR)
\n<\/span><\/span><\/span><\/td>\n		\u00a0<\/td>\nMetallographic analysis of surfaces<\/span><\/span><\/span><\/td>\n2003<\/td>\nRG8<\/td>\n<\/tr>\n
Infrared Microscope<\/span><\/span><\/span> MMax \/ Pike Technologies (USA)<\/td>\n\u00a0<\/td>\nMeasurement of IR spectra of Ge by ATR technique in connection with an FTIR spectrometer<\/span><\/span><\/span><\/td>\n2017<\/td>\nFajgar Ko\u0161t\u011bjn<\/td>\n<\/tr>\n
UV-Vis Fiber Spectrometer<\/span><\/span><\/span> Model 2000 \/ Ocean Optics (USA)<\/td>\n\u00a0<\/td>\nMeasurement of emission spectra, 200 – 800 nm<\/span><\/span><\/span><\/td>\n2004<\/td>\nFajgar Ko\u0161t\u011bjn<\/td>\n<\/tr>\n
UV-Vis Fiber Spectrometer<\/span><\/span><\/span> Model 4000HR \/ Ocean Optics (USA)<\/td>\n\u00a0<\/td>\nMeasurement of emission spectra, high resolution, 230 – 300 nm<\/span><\/span><\/span><\/td>\n2010<\/td>\nFajgar Ko\u0161t\u011bjn<\/td>\n<\/tr>\n
\u00a0<\/td>\n\u00a0<\/td>\n\u00a0<\/td>\n\u00a0<\/td>\n\u00a0<\/td>\n<\/tr>\n
\u00a0<\/td>\n\u00a0<\/td>\n\u00a0<\/td>\n\u00a0<\/td>\n\u00a0<\/td>\n<\/tr>\n
\u00a0<\/td>\n\u00a0<\/td>\n\u00a0<\/td>\n\u00a0<\/td>\n\u00a0<\/td>\n<\/tr>\n
\u00a0<\/td>\n\u00a0<\/td>\n\u00a0<\/td>\n\u00a0<\/td>\n\u00a0<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

Device \/ Manufacturer (Country) \u00a0 Description of the Experiment or Analysis Made Service Pulse IR (TEA) CO2 Laser \/ Plovdiv University (Bulgaria) \u00a0 Laser deposition and ablation with tuneable infrared 9.6 to 10.6 \u03bcm, pulse energy up to 1 J with a repetition rate of 1 Hz 1988 RG8 ArF UV Excimer Laser ASX-750 \/…<\/p>\n","protected":false},"author":15,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_acf_changed":false,"footnotes":""},"class_list":["post-14785","page","type-page","status-publish","hentry"],"acf":[],"_links":{"self":[{"href":"https:\/\/www.icpf.cas.cz\/en\/wp-json\/wp\/v2\/pages\/14785","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.icpf.cas.cz\/en\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.icpf.cas.cz\/en\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.icpf.cas.cz\/en\/wp-json\/wp\/v2\/users\/15"}],"replies":[{"embeddable":true,"href":"https:\/\/www.icpf.cas.cz\/en\/wp-json\/wp\/v2\/comments?post=14785"}],"version-history":[{"count":37,"href":"https:\/\/www.icpf.cas.cz\/en\/wp-json\/wp\/v2\/pages\/14785\/revisions"}],"predecessor-version":[{"id":15133,"href":"https:\/\/www.icpf.cas.cz\/en\/wp-json\/wp\/v2\/pages\/14785\/revisions\/15133"}],"wp:attachment":[{"href":"https:\/\/www.icpf.cas.cz\/en\/wp-json\/wp\/v2\/media?parent=14785"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}