Instrumentation – Research Group of Laser Chemistry
| Device / Manufacturer (Country) | Description of the Experiment or Analysis | Made | Service | |
| Pulse IR (TEA) CO2 Laser / Plovdiv University (Bulgaria) | Laser deposition and ablation with tuneable infrared 9.6 to 10.6 μm, pulse energy up to 1 J with a repetition rate of 1 Hz |
1988 | RG8 | |
| ArF UV Excimer Laser ASX-750 / Semento (Estonia) | Laser deposition and ablation using deep-UV radiation with 193 nm, pulse energy up to 150 mJ with a repetition rate of 10 Hz | 2015 | RG8 | |
| Sputter Coater Q 150T ES Plus / Quorum Technologies Ltd. (UK) | Sputtering of thin conductive (Au, Pt, Ag, Cr) layers for electron microscopy, preparation of carbon layers | 2021 | RG8 | |
| RF Generator Model 300 / Elite (USA) | 13.56 MHz RF plasma generation with a matchbox for silicon layer deposition |
2020 | Fajgar Koštejn | |
| FTIR Spectrometer Nicolet Avatar 360 / Thermo Scientific (USA) | Measurement of IR spectra by transmission, reflection, or ATR technique, basic characterization of vibrational states | 1997 | RG8 | |
| Raman Spectrometer Almega XR / Thermo Scientific (USA) | Measurement of Raman spectra with optical microscopy (Olympus BX51, 473 nm), basic characterization of vibrational states | 2007 | RG8 | |
| UV-Vis Spectrometer Model 1800 / Shimadzu Corp. (Japan) | Measurement of abs. spectra with high resol. (190 – 1100 nm), extension for transmission and reflection mode, optical band gap | 2018 | Fajgar Koštejn | |
| XPS Photoelectron Spectrometer ESCA 3400 / Kratos (UK) |
Determination of surface stoichiometry and chem. states of powders and smaller samples (with a diameter of up to 1 cm), dedusting of the surface with Ar+ ions (depth profiling), measurement of valence spectra and band-gap
|
2014 | Fajgar Koštejn | |
| Scanning Electron Microscope (SEM) Tescan Indusem equipped with EDX 5010 XFlash Detector / Bruker (Germany) | Display of prepared materials and atom determination composition of samples (B and elements with higher atomic weight) from a depth of up to 1 μm with an accuracy of approx. 10 rel%, accelerating voltage 5 – 30 kV | 2012 | Fajgar Koštejn | |
| Powder X-ray Diffractometer D8 Advance Eco / Bruker (Germany) | Measurement of phase composition of powdered solid samples and thin layers, determination of crystallite size 1 to 100 nm, thickness determination of thin layers up to 100 nm by reflection technique |
2020 | Fajgar Koštejn | |
| Thermogravimetric System TG209 F1 Libra / Netzsch (Germany) | Thermogravimetric analysis for measuring the temperature dependence of the decomposition of substances (possibility of connection with FTIR) | 2019 | Jandová | |
| Potentiostat Model 2450EC / Keithley (USA) | It is used for measuring the electrochemical properties of materials, standard measurements of cyclic voltammetry, chronoamperometry, and chronovoltammetry, determining the properties of battery systems for CO2 reduction and water electrolysis | 2018 | Koštejn Jandová | |
| Potentiostat Autolab M101, 10A booster / Metrohm (Netherlands) | 2021 | Dytrych Koštejn | ||
| Potentiostat SP200, 20A booster / BioLogic (Netherlands) | 2021 | Dytrych Koštejn | ||
| Fluorescence Microscope AF3T / Arsenal (ČR) |
Fluorescence and optical microscopy, the possibility of connection with a UV-Vis spectrometer for measuring fluorescence spectra | 2003 | RG8 | |
| Metallographic Microscope AM2T / Arsenal (ČR) |
Metallographic analysis of surfaces | 2003 | RG8 | |
| Infrared Microscope MMax / Pike Technologies (USA) | Measurement of IR spectra of Ge by ATR technique in connection with an FTIR spectrometer | 2017 | Fajgar Koštějn | |
| UV-Vis Fiber Spectrometer Model 2000 / Ocean Optics (USA) | Measurement of emission spectra, 200 – 800 nm | 2004 | Fajgar Koštějn | |
| UV-Vis Fiber Spectrometer Model 4000HR / Ocean Optics (USA) | Measurement of emission spectra, high resolution, 230 – 300 nm | 2010 | Fajgar Koštějn | |